Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings

A. E. Hughes, S. Mayo, Y. S. Yang, T. Markley, S. V. Smith, S. Sellaiyan, A. Uedono, S. G. Hardin, T. H. Muster

Research output: Contribution to conferencePaperpeer-review

15 Citations (Scopus)

Abstract

Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn 3(PO 4) 2 and SrCrO 4) and a filler (rutile TiO 2).The SrCrO 4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO 4/TiO 2 and Zn 3(PO 4) 2/TiO 2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix. © 2011 Elsevier B.V.
Original languageEnglish
Number of pages8
DOIs
Publication statusPublished or Issued - Aug 2012
Externally publishedYes

Keywords

  • Chromate inhibited primer
  • Positron annihilation spectroscopy (PALS)
  • X-ray tomography

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